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期刊信息
  • 主管单位:
  • 中国科学技术协会
  • 主办单位:
  • 中国仪器仪表学会、上海光学仪器研究所、中国光学学会工程光学专业委员会
  • 主  编:
  • 庄松林
  • 地  址:
  • 上海市军工路516号上海理工大学《光学仪器》编辑部
  • 邮政编码:
  • 200093
  • 联系电话:
  • 021-55270110
  • 电子邮件:
  • gxyq@usst.edu.cn
  • 国际标准刊号:
  • 1005-5630
  • 国内统一刊号:
  • 31-1504/TH
  • 邮发代号:
  • 单  价:
  • 15.00
  • 定  价:
  • 90.00
基于颗粒衍射图样数据库的颗粒尺寸反演方法
Particle size inversion method based on particle diffraction pattern database
投稿时间:2025-01-03  
DOI:10.3969/j.issn.1005-5630.202501030004
中文关键词:  颗粒  粒度测量  光衍射图样  数据库
英文关键词:particle  particle sizing  optical diffraction pattern  database
基金项目:国家自然科学基金 (52206102)
作者单位E-mail
肖希飞 上海理工大学 上海市介入医疗器械工程研究中心,上海 200093  
郑泽希 上海理工大学 上海市介入医疗器械工程研究中心,上海 200093
上海理工大学 光学仪器与系统教育部工程中心,上海 200093 
zexizheng@outlook.com 
陈泉 上海理工大学 光学仪器与系统教育部工程中心,上海 200093  
程云章 上海理工大学 上海市介入医疗器械工程研究中心,上海 200093  
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中文摘要:
      目前基于方程求解的颗粒激光衍射测量反演算法存在收敛速度慢、计算资源消耗大、多峰分布测量不准等问题。提出建立一个预先计算的颗粒衍射图样数据库,并结合衍射图样特征来进行颗粒粒度反演测量的方法。依据光衍射(或散射)理论,运用颗粒粒度分布的函数限定法计算得到与颗粒粒度及分布相关的光衍射图样,在傅里叶接收透镜焦距对应的被测颗粒尺寸范围内,计算确定的小步长间隔的不同颗粒尺寸及分布对应的衍射图样,由此建立一个数据库。利用数据库最小二乘搜寻法对颗粒单峰及多峰尺寸分布进行了反演计算仿真,并充分利用图样特征值缩小搜寻范围,减少计算时间。搭建了结构简单的颗粒粒度激光衍射测量系统,采用照相机面阵CCD器件获得颗粒的实际光衍射图样分布。对5种乳胶微粒国家标准物质进行了一系列实验测量,测得的颗粒中位粒径D50误差均在5%以内。理论及实验研究表明,本方法原理及装置结构简单,测量精度较高,能满足工业生产及医药行业对颗粒粒度测量的要求。
英文摘要:
      At present, the inversion algorithm of particle laser diffraction measurement based on equation solving has some problems, such as slow convergence speed, large consumption of computing resources and inaccurate measurement of multi-peak distribution. In this paper, a precalculated database of particle diffraction patterns is established, which is combined with the characteristics of diffraction patterns to measure particle size inversion. According to the theory of optical diffraction (or scattering), the optical diffraction patterns related to particle size and distribution are calculated by using the function limitation method of particle size distribution. In a certain particle size measurement range, the diffraction patterns corresponding to all different particle sizes and distributions are calculated, and a database is established. In this paper, the least square search method is used to invert the particle size distribution of single peak and multi-peak, and the pattern characteristic value is fully used to narrow the search range and reduce the calculation time. A simple structure laser diffraction measurement system for particle size was established, and the actual optical diffraction pattern distribution of particles was obtained by using a camera array CCD device. A series of experiments were carried out to measure 5 kinds of national standard materials of latex particles, and the error of D50 of the measured particles was all within 5%. Theoretical and experimental studies show that the method has simple principle and device structure, high measurement accuracy, and can meet the requirements of industrial production and pharmaceutical industry for particle size measurement.
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