|
| 面向光芯片测试的ATE 数据存储传输系统的设计 |
| Design of ATE data storage and transmission system for optical chip testing |
| 投稿时间：2023-10-26 |
| DOI：10.3969/j.issn.1005-5630.202310260120 |
| 中文关键词: ARM FPGA 嵌入式系统 GPMC EDMA |
| 英文关键词:ARM FPGA embedded system GPMC EDMA |
| 基金项目: |
|
| 摘要点击次数: 1549 |
| 全文下载次数: 874 |
| 中文摘要: |
| 光芯片是在光纤系统中实现光电信号转换的重要器件，因此在生产制造完成后需要经过大量测试。集成电路自动测试设备（auto test equipment，ATE）是现今芯片测试中所使用的主要设备，在对光芯片测试时有自动化程度高、精度高、测试范围广、速度快等优势。由于ATE设备每次测试时需要传输大量数据，而太长的测试时间会提高测试成本，因此ATE系统对数据的交换速度要求很高。为了提高光芯片测试过程中数据传输和存储的效率，设计了一套基于嵌入式系统芯片和FPGA的高速数据存储传输系统，通过使用增强型直接存储器访问模块驱动GPMC接口以提高传输带宽，在FPGA上优化了数据的传输方式以提高DDR3 SDRAM的接口利用率。经过上板测试，单通道下读写带宽分别达到413.3 Mbit/s和984.6 Mbit/s，实现了数据在系统中高速传输与稳定存储。 |
| 英文摘要: |
| Optical chip is an important device to realize photoelectric signal conversion in optical fiber system, so it needs to undergo a lot of tests after manufacturing.As the main equipment used in chip testing today, integrated circuit automatic test equipment (ATE) has the advantages of high automation, high precision, wide test range and fast speed in the test of optical chip. Since the ATE device generates a great many data each time it is tested, and a long test time will increase the test cost, so the ATE system requires a high data rate. In order to improve the Data transmission efficiency and storage during optical chip testing, a high-speed data storage and transmission system based on embedded system chip and FPGA was designed. The enhanced direct memory access module was used to drive the GPMC interface to improve the transmission bandwidth, and the data transmission mode was optimized on FPGA to improve the DDR3 SDRAM utilization. After testing on the board, the read and write bandwidth in single channel reaches 413.3 Mbit/s and 984.6 Mbit/s respectively, realizing high-speed transmission and stable storage of data in the system. |
| HTML 查看全文 查看/发表评论 下载PDF阅读器 |
| 关闭 |
