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期刊信息
  • 主管单位:
  • 中国科学技术协会
  • 主办单位:
  • 中国仪器仪表学会、上海光学仪器研究所、中国光学学会工程光学专业委员会
  • 主  编:
  • 庄松林
  • 地  址:
  • 上海市军工路516号上海理工大学《光学仪器》编辑部
  • 邮政编码:
  • 200093
  • 联系电话:
  • 021-55270110
  • 电子邮件:
  • gxyq@usst.edu.cn
  • 国际标准刊号:
  • 1005-5630
  • 国内统一刊号:
  • 31-1504/TH
  • 邮发代号:
  • 单  价:
  • 15.00
  • 定  价:
  • 90.00
太赫兹光致力近场显微成像技术及应用研究
Terahertz photoinduced force near-field microscopy and application
投稿时间:2022-03-18  
DOI:10.3969/j.issn.1005-5630.2022.005.008
中文关键词:  光致力显微镜  MoS2  太赫兹近场成像  载流子分布
英文关键词:photoinduced force microscopy  MoS2  terahertz near-field imaging  carrier distribution
基金项目:国家重点研发计划(2017YFF0106304、 2016YFF0200306)
作者单位E-mail
冯邱锴 上海理工大学 光电信息与计算机工程学院上海 200093  
刘逍 上海理工大学 光电信息与计算机工程学院上海 200093  
游冠军 上海理工大学 光电信息与计算机工程学院上海 200093 youguanjun@126.com 
摘要点击次数: 53
全文下载次数: 33
中文摘要:
      设计并搭建了太赫兹光致力显微成像系统(THz PiFM),首次在太赫兹波段实现了近场光力纳米显微成像测量。该系统基于原子力显微镜,利用探针对所受力的灵敏检测能力,通过探测探针与样品之间近场偶极相互作用产生的光场梯度力,实现无探测器的太赫兹近场显微成像。利用该系统,对可见光激发下的单层MoS2晶粒进行了近场纳米显微成像表征,并分析了晶粒边缘近场光力信号增强的机制。研究结果表明,THz PiFM对二维材料中的载流子具有高灵敏的探测能力。与传统的太赫兹近场显微成像技术相比,THz PiFM无需太赫兹探测器,而且可获得更加优越的空间分辨率和成像信噪比,是一种低成本、高性能的新型太赫兹近场显微成像技术。
英文摘要:
      In this paper, terahertz photoinduced force microscopy (THz PiFM) is designed and built, which realizes the near-field photoinduced force nanoscopic imaging measurement in the terahertz band for the first time. Based on the atomic force microscopy, the system uses the sensitive detection ability of the probe to the force, and realizes the terahertz near-field microscopic imaging without detector. The system detected the light field gradient force generated by the near-field dipole interaction between the probe and the sample. The near-field nanoscopic imaging characterization of monolayer MoS2 grains excited by visible light was carried out, and the mechanism of near-field optical signal enhancement at the grain edge was analyzed. The results show that THz PiFM has a highly sensitive detection capability for carriers in two-dimensional materials. Compared with the traditional terahertz near-field microscopy imaging technology, THz PiFM does not require terahertz detector, and is a new low-cost, high-performance terahertz near-field microscopy imaging technology, and can achieve superior spatial resolution and imaging signal-to-noise ratio.
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