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| 基于光腔衰荡的反射率测量技术的研究 |
| Reflectance determination based on cavity ringdown |
| 修订日期:2003-11-30 |
| DOI: |
| 中文关键词: 光腔衰荡(CRD),反射率,测量技术 |
| 英文关键词:cavity ringdown (CRD),reflectance,measurement technology |
| 基金项目: |
| 孙宏波 熊胜明 高丽峰 |
| 中国科学院光电技术研究所,中国科学院光电技术研究所,中国科学院光电技术研究所 四川成都610209,四川成都610209,四川成都610209 |
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| 中文摘要: |
| 根据光腔衰荡原理开展了高反射率镜片反射率测量技术的研究。理论上给出了直型腔和折叠腔的反射率计算方法,构建了测量高反镜反射率的实验系统。实验结果表明系统结构简单,易调节,可以测量任意角度的反射率,测量结果精确,可满足高反镜片的各种测量要求。 |
| 英文摘要: |
| The research on high reflectivity mirror reflectivity measurement system was developed according to cavity ringdown theory. The theoretical basis of mirror reflectance determination based on cavity ringdown is introduced and a experiments setup was developed. The results show that this technique has simple setup, high-sensitivity and can apply for measurement of many high reflectance mirror. |
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