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| 成像标定法测量半导体激光器慢轴远场分布 |
| Far-field distribution measurement of a laser diode by using CCD with imaging and calibration technique |
| 修订日期:2003-05-23 |
| DOI: |
| 中文关键词: 半导体激光器,远场分布,CCD测量,成像,标定 |
| 英文关键词:laser diode,far-field distribution,CCD measurement,image transformation,calibration |
| 基金项目: |
| 任杰 洪治 |
| 浙江大学现代光学仪器国家重点实验室,浙江大学现代光学仪器国家重点实验室 浙江杭州310027,浙江杭州310027 |
| 摘要点击次数: 2430 |
| 全文下载次数: 29 |
| 中文摘要: |
| 利用远场成像及标定对比方法,建立了半导体激光器慢轴远场分布的CCD测量系统。介绍了测量的原理和测量系统的组成,并给出了半导体激光器慢轴远场分布的测量结果。实验结果表明,该方法实时性好,测量快速、准确,人为误差因素少,适合仪器化。 |
| 英文摘要: |
| A CCD far-field distribution measurement system with imaging and calibration techniques was established to measure the far-filed distribution along the slow axis of LD.The principle and setup of the system are introduced.Some experimental results are reported which show that the system is capable of realizing real-time,quick,accurate,and less artificial error measurement.The experimental system can be suitably developed to an instrument. |
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