|
| 电子探针中X光分光谱仪波长分辨力的讨论 |
| A discussion about the wavelength resolution of X-ray spectrometer of EPMA |
| 修订日期:2000-08-27 |
| DOI: |
| 中文关键词: X射线 谱仪 分辨力 |
| 英文关键词:X-ray spectrometer resolution |
| 基金项目: |
| 江家蓥 |
江家蓥(南京江南光电集团股份有限公司,江苏南京210037)
|
| 摘要点击次数: 2424 |
| 全文下载次数: 15 |
| 中文摘要: |
| 讨论了电子探针中X光分光谱仪的波长分辨力。除X光谱线的自然宽度外,弯晶光谱仪的分辨力是由一些实际因素决定的弯晶光学系统的固有偏差、衍射晶体的镶嵌结构、晶体的有效厚度及X光源的有限体积。在不同条件下,上述因素中的一个或几个对限制波长分辨起主要作用。 |
| 英文摘要: |
| The problem of wavelength resolution of X-ray spectrometer of the electron probe is discussed. Apart from the natural X-ray line breadth, the resolution of a curved-crystal spectrometer depends on a number of practical factors. These factors are mainly the inherent deviation of curved-crystal optical system. the mosaic structure and the effective depth of diffraction crystal and/or the finite volume of X-ray source. On different concrete cases, one of the above mentioned factors or several others may play an important part in limitation of resolution |
| HTML 查看全文 查看/发表评论 下载PDF阅读器 |
| 关闭 |