|
| 通过散射板干涉仪的改型实现非球面的零测试 |
| Measurement Aspherical Surface by a New Kind Scatter Plate Interferometer |
| |
| DOI: |
| 中文关键词: 散射板干涉仪,零测试,非球面 |
| 英文关键词:Scatter Plate Interferometer, Null-test, Aspherical Surface |
| 基金项目: |
| 徐敏 游艺锋 |
| 浙江大学光科系!杭州310027 |
| 摘要点击次数: 2273 |
| 全文下载次数: 20 |
| 中文摘要: |
| 通过对散射板干涉位的适当改型,利用散射板上高轮点产生的附加程基来补偿球面和非球面之间的光程基,无需任何零光学元件,就可产生一种新型的二次非球面零测试法。本文对这一方法进行了描述、分析和实验。 |
| 英文摘要: |
| A new kind scatter plate interferometer which achieved null-testing of aspheri-cal surface. The approach makes use of a large aperture scatter plate for compensating theoptical path differences between spherical and aspherical surface, needn't any null optical el-ements. This paper describes the method principle and give a testing. |
| HTML 查看全文 查看/发表评论 下载PDF阅读器 |
| 关闭 |
|
|
|