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| 基于红外测温技术的微波功率器件降温曲线测量系统 |
| Cooling curve measurement system for microwave power devices based on infrared thermal measurement technique |
| 投稿时间：2015-07-01 |
| DOI：10.3969/j.issn.1005-5630.2016.02.002 |
| 中文关键词: 红外测温技术 降温曲线 电学法 |
| 英文关键词:infrared thermal measurement technique cooling curve electrical method |
| 基金项目: |
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| 中文摘要: |
| 为了有效实现对微波功率器件的热特性分析,在瞬态红外设备基础上开发了一套用于获取微波功率器件降温曲线的测量系统。分析了瞬态红外设备的原理,并根据降温曲线测量的需要对设备进行改造,开发了数据采集和处理系统,扩展了原有设备的功能,重新设计了测温流程、数据处理算法和相应的软件系统,实现了对GaN HEMT器件不同工作条件下降温曲线的测量。测量的降温曲线满足现有国际标准JESD51系列的要求,在器件热特性分析方面具有较好的应用前景。 |
| 英文摘要: |
| A set of cooling curve measurement system for microwave power devices was developed based on a transient infrared tester in order to analyze the thermal characteristics of power devices.Working principles of the transient infrared tester were analyzed.A set of data acquisition and process system was developed to replace the corresponding part of the transient infrared tester.The working procedure and data processing software were designed to meet the demands of cooling curve measurement.Cooling curve of GaN HEMT device was obtained under varied working conditions.The obtained cooling curve fulfilled the requirements of JESD51 standard series. |
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